We have compiled a list of manufacturers, distributors, product information, reference prices, and rankings for Film thickness measurement.
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Film thickness measurement Product List and Ranking from 4 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.

Film thickness measurement Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.

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  4. 4 本田ビジネスシステムズ Kanagawa//Automobiles and Transportation Equipment
  5. 5 オーシャンフォトニクス Tokyo//Testing, Analysis and Measurement
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Film thickness measurement Product ranking

Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.

  1. Film Thickness Measurement Comprehensive Catalog
  2. Measurement of oxide film thickness
  3. Thickness measurement of SiO2 and SiN using a micro-spectroscopic film thickness gauge.
  4. 4 Fluorescent X-ray film thickness measurement
  5. 4 High-precision film thickness measurement on transparent substrates using a micro-spectroscopic film thickness gauge.

Film thickness measurement Product List

1～9 item / All 9 items

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Film thickness measurement

Film thickness measurement

We will provide a detailed explanation of the application information regarding film thickness measurement.

Ocean Optics provides both modular and fully integrated systems for measuring optical and non-optical film thickness characteristics for applications in the semiconductor, industrial, medical, and consumer markets. Customers configure systems to measure the thickness of silicon wafers, determine photoresist layers for masks, and test the hardness and wear of coatings. Components for high-volume OEM applications are also available. These devices cover the vacuum ultraviolet to infrared range and achieve a level of accuracy and reproducibility that makes spectroscopic techniques useful for a wide range of applications. *For more details, please refer to the PDF materials or feel free to contact us.*

  • Spectroscopic Analysis Equipment
  • others

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Non-contact inflation film thickness measurement and gas barrier layer thickness measurement.

Non-contact inflation film thickness measurement and gas barrier layer thickness measurement.

Infrared non-contact thickness gauge "Easy operation and maintenance-free!" Specific layer thickness measurement within multilayer films.

<Compact and Lightweight, Customizable> Can be introduced into narrow installation spaces of existing lines <Ready-to-Use Operability> Automatically creates measurement lines from reference pieces Measurement can be started immediately <Maintenance-Free> No short-term replacement parts such as light sources or line sources <Includes Computer for Operation and Display> The system is complete with the included computer (data output available)

  • Coating thickness gauge

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Installation of 1 line with 3 channels, and measurement is possible before and after the process! Multi-point film thickness measurement.

Installation of 1 line with 3 channels, and measurement is possible before and after the process! Multi-point film thickness measurement.

Multi-point film thickness measurement capable of pre- and post-measurements in multiple channels. It uses multiple receiving heads to measure the film thickness values at multiple points simultaneously.

The "FF8" allows for non-contact multi-point thickness measurement by measuring the sample's reflectance (interference waveform) and analyzing the thickness values using methods such as FFT (Fast Fourier Transform thickness gauge) and curve fitting thickness gauges. In addition to thickness measurement, it can also measure the thickness and refractive index of films and glass, and with optional features, it can perform measurements and analyses for multilayer films, curve fitting methods, microscopy, mapping measurements, color measurements, and component concentration analysis. To efficiently measure and analyze differences in film thickness and variations, automatic mapping measurements can be performed using an automatic XY stage. (Mapping film measurement) 【Features】 ■ Measures the sample's reflectance and analyzes thickness values using FFT and other methods ■ Capable of measuring the thickness and refractive index of films and glass in addition to thickness measurement ■ Measurement data can be saved as files and reanalyzed later ■ Can also be used for inline thickness measurement ■ Custom specifications can be accommodated *For more details, please refer to the PDF document or feel free to contact us.

  • Optical Measuring Instruments

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Non-destructive film thickness measurement 'PosiTest'

Non-destructive film thickness measurement 'PosiTest'

Compact, lightweight, and stable precision. Usable in any location!

The "PosiTest" allows for accurate and highly reliable non-destructive measurements. It uses carbide tips, ensuring a long lifespan and maintained precision. Calibration can be easily readjusted by simply moving the center of the dial cover. It fits the entire part and can measure even just the tip. 【Features】 ■ NIST-compliant calibration ■ Scale range suitable for all applications ■ Complies with international standards ■ Durable construction resistant to shock, water, acids, and solvents ■ Unique design for easy handling and stability during measurement *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Coating thickness gauge

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